Search Results

  • Direct chemical in-depth profile analysis and thickness quantification of nanometer multilayers using pulsed-rf-GD-TOFMS [2010]

    Category:
    Artículos
    Authors:
    Agnès Tempez , Rebeca Valledor González , Carlos Quirós Fernández , Nerea Bordel García , José Ignacio Martín Carbajo , Jorge Pisonero Castro , Alfredo Sanz Medel
    Date:
    01 of January of 2010
    It Is a Part of:
    Analytical and Bioanalytical Chemistry