Search Results

  • Characterization of Doped Amorphous Silicon Thin Films through the Investigation of Dopant Elements by Glow Discharge Spectrometry. A Correlation of Conductivity and Bandgap Energy Measurements [2011]

    Category:
    Artículos
    Authors:
    José Luis Menéndez Río , Armando Menéndez Estrada , María Rosario Pereiro García , Olaya Lorenzo , Pascal Sánchez , Beatriz Fernández García , David Gómez Plaza
    Date:
    01 of January of 2011
    It Is a Part of:
    International Journal of Molecular Sciences