Characterization of Doped Amorphous Silicon Thin Films through the Investigation of Dopant Elements by Glow Discharge Spectrometry. A Correlation of Conductivity and Bandgap Energy Measurements [2011]
Category:
Artículos
Authors:
José Luis Menéndez Río , Armando Menéndez Estrada , María Rosario Pereiro García , Olaya Lorenzo , Pascal Sánchez , Beatriz Fernández García , David Gómez Plaza
