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  • Analytical potential of rf-PGD-TOFMS for depth profiling of an oxidized thin film composite [2016]

    Category:
    Artículos
    Authors:
    Cristina González Gago , Jorge Pisonero Castro , R. Sandín , José Félix Fuertes Martínez , Alfredo Sanz Medel , Nerea Bordel García
    Date:
    01 of January of 2016
    It Is a Part of:
    Journal of Analytical Atomic Spectrometry